1. M. Han , H. Kim , H. Seo, B. Ma , and J. W. Park, "Photovoltaic Efficiency Enhancement by the Generation of an Embedded Silica-Like Passivation Layer along the P3HT/PCBM Interface Using an Asymmetric Block-Copolymer Additive " Adv. Mat. 24 (47) 6311-6317 (2012). (Published on 09/13/2012)
J. Kim, S. Bang, S. Lee, S. Shin, J. Park, H. Seo* and H. Jeon*, "A study on H2 plasma treatment effect on a-IGZO thin film transistor", J. Mat. Res. 27 (17) 2318-2325 (2012). (*Co-corresponding author, Published on 06/06/2012)
S. Bang, S. Lee, Y. Ko, J. Park, S. Shin, H. Seo* and H. Jeon*, Photocurrent detection of chemically tuned hierarchical ZnO nanostructures grown on seed layers formed by atomic layer deposition", Nanoscale Res. Lett. 7, 290 (2012) doi:10.1186/1556-276X-7-290 (*Co-corresponding author, Published on 06/06/2012)
S. Bang, S. Lee, T. Park, Y. Ko, S. Shin, S.-Y. Yim, H. Seo* and H. Jeon*, "Dual optical functionality of local surface plasmon resonance for RuO2 nanoparticle-ZnO nanorod hybrids grown by atomic layer deposition", J. Mater. Chem. 22, 14141-14148 (2012) (*Co-corresponding author, Published on 06/27/2012)
H. Seo*, S. Kwon*, K. J. Jeon, and J. Y. Park, "Reversible Bistability of Nanoscale Conductance on Single Layer Graphene/Oxide Junction", Appl. Phys. Lett. 100, 123101 (2012) (*Equal Contribution) (Published on 03/19/2012)
H. Seo*, Y. J. Cho, J. Kim, and D. K. Choi*, "Photochemical Doping of Metal Oxide Semiconductors via Electronically Mediated Surface-OH Reaction", In preparation. (*Co-corresponding author)
Y. K. Lee, C. H. Jung, J. Park, H. Seo, G. A. Somorjai, and J. Y. Park, "Surface Plasmon-Driven Hot Electron Flow Probed with Metal-Semiconductor Nanodiodes", Nano Lett. 11 (10) 4251-4255 (2011). (Published on 11/09/2011)
L. R. Baker, A. Hervier, H. Seo, G. Kennedy, K. Komvopoulosand, and G. A. Somorjai, "Highly n-Type Titanium Oxide as an Electronically Active Support for Platinum in the Catalytic Oxidation of Carbon Monoxide", J. Phys. Chem. C. 115, 16006-16011 (2011). (Published on 07/11/2011)
J. Y. Park, L. Belau, H. Seo, and G. A. Somorjai, "Improved Oxidation Resistance of RuSi Capping Layer for Extreme Ultraviolet (EUV) Lithography Reflector", J. Vac. Sci. B 29, 014602-1~5 (2011). (Published on 06/06/2011)
H. Seo*, L. R. Baker*, A. Hervier, J. Kim, J. L. Whitten, and G. A. Somorjai, "Generation of Highly n-Type Titanium Oxide Using Plasma Fluorine Insertion", Nano Lett. 11, 751-756 (2011). (*Equal Contribution, Published on 12/22/2010)
N. G. Cho, H. Seo*, H. D. Kim, H. G. Kim, J. Kim, and I. D. Kim*, "Characterization on Band-Edge Electronic Structure of High-k Bi1.5Zn1.0Nb1.5O7 and MgO- Bi1.5Zn1.0Nb1.5O7 Composite Gate Dielectrics for ZnO-Thin Film Transistors", Electrochem. Solid-State Lett. 14 (1), G4-G7 (2010). (*Co-corresponding author, Published on 11/11/2010)
D. H. Kim, H. Seo*, K. B. Chung, N. G. Cho, H. G. Kim, and I. D. Kim*, "Low voltage operating InGaZnO4 based flexible thin film transistors using room temperature grown Mg2Hf5O12 gate insulator", J. Electrochem. Soc. 157 (10), H964~968 (2010). (* Co-corresponding author, Published on 08/25/10)
H. Seo, Y.-J. Cho, J. Kim, S. M.bobade, K.-Y. Park, J. Lee, and D.-K. Choi, "Permanent Optical Doping of Amorphous Metal Oxide Semiconductors by Deep Ultraviolet Irradiation at Room Temperature", Appl. Phys. Lett. 96, 222101-1~3 (2010). (published on 05/31/10)
H. Seo, C.-J Park, Y.-J. Cho, Y.-B. Kim, and D.-K. Choi, "Correlation of Band Edge Native Defect State Evolution to Bulk Mobility Changes in ZnO Thin Films", Appl. Phys. Lett. 96, 232101-1~3 (2010). (published on 06/07/10)
H. Seo, J. Y. Park, T. Liang, and G. A. Somorjai, "Electrochemically Enhanced Wet Cleaning of Ru Capping Thin Film for EUV Lithography Reflector", J. Electrochem. Soc. 157 (11), H414~419 (2010). (published on 02/18/2010)
H. Seo, Y. Kim, G. Lucovsky, I. D. Kim, K. B. Chung, H. Kobayashi, and D. K. Choi, "Enhanced Leakage Current Properties of Nickel-doped Ba0.6Sr0.4TiO3 Thin Films driven by Band Edge State Changes", J. Appl. Phys. 107,
024109-1~7 (2010). (published on 01/28/2010)
K. B. Chung, J. P. Long, H. Seo, G. Lucovsky, and D. Nordlund, "Thermal evolution and electrical correlation of defect states in Hf-based high-k dielectrics on n-type Ge (100): Local atomic bonding", J. Appl. Phys. 106, 074102-1~4 (2009). (Published on 10/05/2009)
H. Seo, F. Bellenger, K. B. Chung, M. Houssa, M. Meuris, M. Heyns, and G. Lucovsky, "Extrinsic defects at interfaces of GeOx/HfO2 and Al2O3 gate stacks on Ge (100) substrates", J. Appl. Phys. 106, 044909 (2009).
(Published on 8/26/2009)
H. Seo, K. B. Chung J. P. Long, and G. Lucovsky, "Preparation of Native Oxide and Carbon Minimized Ge surface by NH4OH based Cleaning for Deposition of High-k Dielectrics", J. Electrochem. Soc. 156, H813~817 (2009).
(Published on 09/16/2009)
L. B. Jeong Y. Park, T. Liang, H. Seo, and G. A. Somorjai, "Chemical Effect of Dry and Wet Cleaning of the Ru Protective Layer of the Extreme Ultraviolet (EUV) Lithography Reflector", J. Vac. Sci. Technol. B 27 (4), 1919~1925 (2009).
(published on 07/09/09)
G. Lucovsky, H. Seo, J. P. Long, K. B. Chung, R. Vasic, M. Ulrich, "Defect states in HfO2 on deposited on Ge(111) and Ge(100) substrates", Appl. Surf. Sci. 255, 6443~6450 (2009). (published on 10/08/08)
G. Lucovsky, J. P. Long, K.-B. Chung, H. Seo, B. Watts, R. Vasic, and M. D. Ulrich, "Predeposition plasma nitridation process applied to Ge substrates to passivate interfaces between crystalline-Ge substrates and Hf-based high-K dielectrics", J. Vac. Sci. Technol. B 27 (1), 294~299 (2009). (published on 02/09/09)
G. Lucovsky, S. Lee, J.P. Long, H. Seo, and J. L?ning, " Interfacial transition regions at germanium/Hf oxide based dielectric interfaces: Qualitative differences between non-crystalline Hf Si oxynitride and nanocrystalline HfO2 gate stacks", Microelectron. Eng. 86, 224~234 (2009). (published on 06/16/08)
"Generation of Highly N-type, Defect Passivated Transition Metal Oxides Using Plasma Fluorine Insertion" U.S. Patent Application Ser. No: 61/423,959, December 16, 2010 & International Patent Application Ser. No: PCT/2011/065587 (2011).
"Oxide doping for catalysis" Disclosure International Patent Ser. No: 127252 (2011).
"Catalytic Field Effect Transistor" Disclosure International Patent Ser. No: 127206 (2011).
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H. Seo, J. Kim, J. Kim, and G. Lucovsky, "Evolution of Band Edge Energy States with a Local Structure Changes in Nanocrystalline TiO2 films", International Conference on Electronic Materials and Nanotechnology for Green Environment, Jeju, Korea, Sep. 19 2012 (Oral)
H. Seo, J. H. Park, J. Kim, J. S. Kim, D. K. Choi, "Photochemically Highly N-Doped InGaZnO and ZnO Semiconductors via Electronically Mediated Surface-OH Reaction", International Conference on Electronic Materials and Nanotechnology for Green Environment, Jeju, Korea, Sep. 19 2012 (Oral).
S. Bang, S. Lee, T. Park, Y. Ko, S. Shin, J. Kim, H. Seo, and H. Jeon, "Dual Optical Functionality of Local Surface Plasmon Resonance for RuO2 Nanoparticle/ZnO Nanorod Hybrids", International Union of Materials Research Society - International Conference in Asia 2012, BEXCO, Busan, Korea , August 26-31, 2012. (Oral)
H Seo, L. R. Baker, A. Hervier, J. Kim, J. L. Whitten, and G. A. Somorjai, "Generation of Highly n-Type Titanium Oxide Using Plasma Fluorine Insertion", 2011 MRS Spring Meeting, San Francisco, CA, USA, April 25-29, 2011. (Oral)
A. Hervier, H Seo, L. R. Baker, and G. A. Somorjai, "Tuning the surface chemistry of a catalyst by modifying its electronic structure", 241st ACS National Meeting & Exposition, Anaheim, California, USA, March 27-31, 2011. (Oral)
L. R. Baker, H Seo, A. Hervier, and G. A. Somorjai , "Electronic mediation of surface chemistry at the metal-oxide interface", 241st ACS National Meeting & Exposition, Anaheim, California, USA, March 27-31, 2011.
H. Seo, J. Y. Park, T. Laing, G. Somorjai, "The Optimized Wet Cleaning for Extreme Ultraviolet (EUV) Masks: Cleaning Efficiency for Residual Photoresist and Ru Capping Layer Surface", American Vacuum Society 56th International symposium, San Jose, CA, November 8-13, 2009.
G. Lucovsky, H. Seo, K. B. Chung, and J. Kim "Spectroscopic detection of (i) intrinsic band edge defects, and (ii) transition metal (TM) and rare earth lanthanide (REL) atom occupied states in elemental and complex oxides: a novel pathway to (i) device reliability and (ii) increased functionality in ULSI CMOS", 10th International Conference on Ultimate Integration of Silicon, Aachen, Germany, March 18-20, 2009. (Oral)
G. Lucovsky, J.P. Long, H. Seo, K-B. Chung, " Process Induced Defects at Ge/High-k interfaces and in HfO2 and HfSiON dielectrics in Gate Stack Hetero-structures", 36th Conference on the Physics and Chemistry of Semiconductor Interfaces, Santa Barbara, California, Jan. 12, 2009. (Oral)